Computer vision (CV) and image processing are two closely related fields that utilize techniques from artificial intelligence (AI) and pattern recognition to derive meaningful information from images, ...

Technology is continuously advancing and exponentially increasing the amount of data produced. Data comes from a multitude of sources and formats, requiring systems to process different algorithms.

AI thrives on data but feeding it the right data is harder than it seems. As enterprises scale their AI initiatives, they face the challenge of managing diverse data pipelines, ensuring proximity to ...

A new technical paper titled “Electron Microscopy-based Automatic Defect Inspection for Semiconductor Manufacturing: A Systematic Review” was published by researchers at KU Leuven and imec. “In this ...