Abstract: A highly reliable 2-bits/cell split-gate flash memory cell in a novel program-disturbs immune array architecture is fabricated and demonstrated. Using a novel metal interconnect technique, a ...
Abstract: Microwave nondestructive testing (NDT) technology developed rapidly, but crack detection in metal surface is facing many troubles, such as hard quantitation and low sensitivity. To solve ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results